Search results for "Refractive index contrast"
showing 2 items of 2 documents
Near-field scanning optical microscopy to study nanometric structural details of LiNbO3 Zn-diffused channel waveguides
2008
A near-field scanning optical microscope (NSOM) is used to perform structural and optical characterization of the surface layer after Zn diffusion in a channel waveguide fabricated on lithium niobate. A theoretical approach has been developed in order to extract refractive index contrast from NSOM optical transmission measurements (illumination configuration). As a result, different solid phases present on the sample surface can be identified, such as ZnO and ZnNb2O6. They appear like submicrometric crystallites aligned along the domain wall direction, whose origin can be ascribed to some strain relaxation mechanism during the annealing process after Zn diffusion. Jose.Canet-Ferrer@uv.es
Near-IR- and UV-femtosecond laser waveguide inscription in silica glasses
2019
The influence of laser parameters on silica based waveguide inscription is investigated by using femtosecond laser pulses at 1030 nm (near-IR) and at 343 nm (UV). Negative phase contrast microscopy technique is used to measure the refractive index contrast for different photo-inscribed waveguides and shows the effects of both laser wavelength and scanning speed. In particular, UV photons have a higher efficiency in the waveguide production process as also confirmed by the lower optical losses at 1550 nm in these waveguides. These measurements are combined with micro-Raman and photoluminescence techniques, highlighting that laser exposure induces both structural modification of the silica an…